Transmission electron microscopy : diffraction, imaging, and spectrometry

著者

• Carter, C. Barry
• Williams, David B. (David Bernard)
• Thomas, J. M. (John Meurig)

書誌事項

Transmission electron microscopy : diffraction, imaging, and spectrometry

C. Barry Carter, David B. Williams (eds.) ; [foreword by Sir John Meurig Thomas]

Springer, c2016

• : [hardback]

注記

"This text is a companion volume to Transmission electron microscopy : a textbook for materials sciences by Williams and Carter."--P. [4] of cover

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BB22301599
• ISBN:
  • 9783319266497
• LCCN: 2016945257
• 出版国コード: gw
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Berlin
• ページ数/冊数: xxxiii, 518 p.
• 大きさ: 29 cm