The application of electron microscopy to materials science : proceedings of an International Workshop, held in China, Gauonzhou, August 1988

Author(s)

Bibliographic Information

The application of electron microscopy to materials science : proceedings of an International Workshop, held in China, Gauonzhou, August 1988

editor, K.H. Kuo ; sponsored by The Chinese Academy of Sciences, The International Centre for Theoretical Physics(Trieste)

(Diffusion and defect data : solid state data, Pt. B. solid state phenomena ; v. 5)

Trans tech Publications , Sci-Tech Publications, [1989]

  • : [pbk]

Other Title

Solid state phenomena

Available at  / 2 libraries

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Note

"Focus -- electron microscopy"

"SSP"

Including bibliographical references

Author index: p. [211]

Related Books: 1-1 of 1

Details

  • NCID
    BB22606133
  • ISBN
    • 3908044014
  • Country Code
    lh
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    [S.l.],Vaduz, Leichtenstein
  • Pages/Volumes
    209 p.
  • Size
    25 cm
  • Parent Bibliography ID
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