The application of electron microscopy to materials science : proceedings of an International Workshop, held in China, Gauonzhou, August 1988
著者
書誌事項
The application of electron microscopy to materials science : proceedings of an International Workshop, held in China, Gauonzhou, August 1988
（Diffusion and defect data : solid state data, Pt. B. solid state phenomena ; v. 5）
Trans tech Publications , Sci-Tech Publications, [1989]
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- タイトル別名
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Solid state phenomena
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注記
"Focus -- electron microscopy"
"SSP"
Including bibliographical references
Author index: p. [211]
