The application of electron microscopy to materials science : proceedings of an International Workshop, held in China, Gauonzhou, August 1988
著者
書誌事項
The application of electron microscopy to materials science : proceedings of an International Workshop, held in China, Gauonzhou, August 1988
（Diffusion and defect data : solid state data, Pt. B. solid state phenomena ; v. 5）
Trans tech Publications , Sci-Tech Publications, [1989]
- : [pbk]
- タイトル別名
-
Solid state phenomena
大学図書館所蔵 件 / 全2件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
"Focus -- electron microscopy"
"SSP"
Including bibliographical references
Author index: p. [211]
内容説明・目次
内容説明
Solid State Phenomena Vol. 5
目次
Electron Energy Loss Spectroscopy
Localised Valence Energy Loss Spectroscopy in the Scanning Transmission Electron Microscope
Analytical Scanning Electron Microscopy for Solid Surface
Profile Imaging of Surfaces and Surface Reactions
Imaging of Oxygen Atoms in Cuprous Oxide and a New Series of Suboxides of Copper and Nickel
Convergent Beam Electron Diffraction Study of Semiconductor Superlattices and High TC Superconducting Oxides
Electron Diffraction and Modulated Structures
Dynamics of Discommensuration in Commensurate-Incommensurate Phase Transition of Dielectrics and Alloys
The Roles of Defects during Phase Transitions in Complex Oxide Crystals
High Resolution Electron Microscopic Observation of Fission Tracks in Zircon
Electron Diffraction and Microscopy Evidences of Quasicrystals
Electron Diffraction and HREM Study on Imperfect Icosahedral Quasicrystals
Crystal Structure Analysis of Organic Solid Solutions and Eutectics in the Electron Microscope: Paraffins, Polymers and Lipids
「Nielsen BookData」 より