Optical and infrared interferometry and imaging V : 27 June - 1 July 2016 Edinburgh, United Kingdom

著者

• Malbet, Fabien.
• Creech-Eakman, Michelle J.
• Tuthill, Peter G.
• Society of Photo-optical Instrumentation Engineers
• American Astronomical Society

書誌事項

Optical and infrared interferometry and imaging V : 27 June - 1 July 2016 Edinburgh, United Kingdom

Fabien Malbet, Michelle J. Creech-Eakman, Peter G. Tuthill, editors ; sponsored by SPIE ; cooperating organizations ; American Astronomical Society (United States) ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 9907）

SPIE, c2016

• : [set]
• pt. 1
• pt. 2

注記

Includes bibliographical references and author index

内容説明・目次

内容説明

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BB23329356
• ISBN:
  • 9781510601932
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: 2 v.
• 大きさ: 28 cm
• 分類:
  • LCC : QC410.9
  • DC23 : 535/.470287
• 件名:
  • LCSH : Interferometry -- Congresses
  • LCSH : Infrared imaging -- Congresses
• 親書誌ID:
  • BA0022700X