Optical and infrared interferometry and imaging V : 27 June - 1 July 2016 Edinburgh, United Kingdom

著者

• Malbet, Fabien.
• Creech-Eakman, Michelle J.
• Tuthill, Peter G.
• Society of Photo-optical Instrumentation Engineers
• American Astronomical Society

書誌事項

Optical and infrared interferometry and imaging V : 27 June - 1 July 2016 Edinburgh, United Kingdom

Fabien Malbet, Michelle J. Creech-Eakman, Peter G. Tuthill, editors ; sponsored by SPIE ; cooperating organizations ; American Astronomical Society (United States) ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 9907）

SPIE, c2016

• : [set]
• pt. 1
• pt. 2

注記

Includes bibliographical references and author index

詳細情報

• NII書誌ID(NCID): BB23329356
• ISBN:
  • 9781510601932
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: 2 v.
• 大きさ: 28 cm
• 分類:
  • LCC : QC410.9
  • DC23 : 535/.470287
• 件名:
  • LCSH : Interferometry -- Congresses
  • LCSH : Infrared imaging -- Congresses
• 親書誌ID:
  • BA0022700X