Optical and infrared interferometry and imaging V : 27 June - 1 July 2016 Edinburgh, United Kingdom

Author(s)

• Malbet, Fabien.
• Creech-Eakman, Michelle J.
• Tuthill, Peter G.
• Society of Photo-optical Instrumentation Engineers
• American Astronomical Society

Bibliographic Information

Optical and infrared interferometry and imaging V : 27 June - 1 July 2016 Edinburgh, United Kingdom

Fabien Malbet, Michelle J. Creech-Eakman, Peter G. Tuthill, editors ; sponsored by SPIE ; cooperating organizations ; American Astronomical Society (United States) ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 9907）

SPIE, c2016

• : [set]
• pt. 1
• pt. 2

Note

Includes bibliographical references and author index

Description and Table of Contents

Description

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

by "Nielsen BookData"

• NCID: BB23329356
• ISBN:
  • 9781510601932
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: 2 v.
• Size: 28 cm
• Classification:
  • LCC : QC410.9
  • DC23 : 535/.470287
• Subject Headings:
  • LCSH : Interferometry -- Congresses
  • LCSH : Infrared imaging -- Congresses
• Parent Bibliography ID:
  • BA0022700X