High-resolution electron microscopy
著者
書誌事項
High-resolution electron microscopy
Oxford University Press, 2017, c2013
4th ed
- : pbk
- タイトル別名
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Experimental high-resolution electron microscopy
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注記
"Fourth edition published in 2013, previously editions were entitled Experimental high-resolution electron microscopy, first published in paperback 2017"--T.p. verso
Includes bibliographical references and index
内容説明・目次
内容説明
This new fourth edition of the standard text on atomic-resolution transmission electron microscopy (TEM) retains previous material on the fundamentals of electron optics and aberration correction, linear imaging theory (including wave aberrations to fifth order) with partial coherence, and multiple-scattering theory. Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of the procedures needed to obtain the highest
quality images of atoms and molecules using a modern TEM or STEM electron microscope. Applications sections have been updated - these include the semiconductor industry, superconductor research, solid state chemistry and nanoscience, and metallurgy, mineralogy, condensed matter physics, materials
science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on electron holography, aberration correction, field-emission guns, imaging filters, super-resolution methods, Ptychography, Ronchigrams, tomography, image quantification and simulation, radiation damage, the measurement of electron-optical parameters, and detectors (CCD cameras, Image plates and direct-injection solid state detectors). The theory of Scanning transmission electron
microscopy (STEM) and Z-contrast are treated comprehensively. Chapters are devoted to associated techniques, such as energy-loss spectroscopy, Alchemi, nanodiffraction, environmental TEM, twisty beams for magnetic imaging, and cathodoluminescence. Sources of software for image interpretation and
electron-optical design are given.
目次
1: Preliminaries
2: Electron Optics
3: Wave Optics
4: Coherence and Fourier Optics
5: Imaging Thin Crystals and their Defects
6: Imaging Molecules: Radiation Damage
7: Image Processing, Super-Resolution, Diffractive Imaging
8: STEM and Z-contrast
9: Electron Sources and Detectors
10: Measurement of Electron-Optical Parameters
11: Instabilities and the Microscope Environment
12: Experimental Methods
13: Associated Techniques and Software Resources
Appendices
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