Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach

著者

    • Sun, Yichuang

書誌事項

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach

edited by Yichuang Sun

(IET circuits, devices and systems series, 19)

The Institution of Engineering and Technology, 2008

  • pbk

大学図書館所蔵 件 / 2

この図書・雑誌をさがす

注記

Includes bibliographical references and index

収録内容

  • Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun
  • Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli
  • Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He
  • Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd
  • DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts
  • Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan
  • Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson
  • Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda
  • Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson
  • On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio
  • Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun

内容説明・目次

内容説明

Systems on Chip (SoC) for communications, multimedia and computer applications have recently received much international attention; one such example being the single-chip transceiver. Modern microelectronic design adopts a mixed-signal approach as a complex SoC is a mixed-signal system including both analogue and digital circuits. Automatic testing becomes crucially important to drive down the overall cost of next generation SoC devices. Test and fault diagnosis of analogue, mixed-signal and RF circuits, however, proves much more difficult than that of digital circuits due to tolerances, parasitics and nonlinearities and therefore, together with challenging tuning and calibration, remains the bottleneck for automatic SoC testing. This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book contains eleven chapters written by leading researchers worldwide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. An essential reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students.

目次

Chapter 1: Fault diagnosis of linear and non-linear analogue circuits Chapter 2: Symbolic function approaches for analogue fault diagnosis Chapter 3: Neural-network-based approaches for analogue circuit fault diagnosis Chapter 4: Hierarchical/decomposition techniques for large-scale analogue diagnosis Chapter 5: DFT and BIST techniques for analogue and mixed-signal test Chapter 6: Design-for-testability of analogue filters Chapter 7: Test of A/D converters: From converter characteristics to built-in self-test proposals Chapter 8: Test of Sigma Delta converters Chapter 9: Phase-locked loop test methodologies: Current characterization and production test practices Chapter 10: On-chip testing techniques for RF wireless transceiver systems and components Chapter 11: Tuning and calibration of analogue, mixed-signal and RF circuits

「Nielsen BookData」 より

関連文献: 1件中  1-1を表示

詳細情報

ページトップへ