Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach
著者
書誌事項
Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach
（IET circuits, devices and systems series, 19）
The Institution of Engineering and Technology, 2008
- pbk
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注記
Includes bibliographical references and index
収録内容
- Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun
- Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli
- Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He
- Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd
- DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts
- Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan
- Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson
- Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda
- Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson
- On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio
- Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun
内容説明・目次
内容説明
Systems on Chip (SoC) for communications, multimedia and computer applications have recently received much international attention; one such example being the single-chip transceiver. Modern microelectronic design adopts a mixed-signal approach as a complex SoC is a mixed-signal system including both analogue and digital circuits. Automatic testing becomes crucially important to drive down the overall cost of next generation SoC devices. Test and fault diagnosis of analogue, mixed-signal and RF circuits, however, proves much more difficult than that of digital circuits due to tolerances, parasitics and nonlinearities and therefore, together with challenging tuning and calibration, remains the bottleneck for automatic SoC testing. This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book contains eleven chapters written by leading researchers worldwide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. An essential reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students.
目次
Chapter 1: Fault diagnosis of linear and non-linear analogue circuits
Chapter 2: Symbolic function approaches for analogue fault diagnosis
Chapter 3: Neural-network-based approaches for analogue circuit fault diagnosis
Chapter 4: Hierarchical/decomposition techniques for large-scale analogue diagnosis
Chapter 5: DFT and BIST techniques for analogue and mixed-signal test
Chapter 6: Design-for-testability of analogue filters
Chapter 7: Test of A/D converters: From converter characteristics to built-in self-test proposals
Chapter 8: Test of Sigma Delta converters
Chapter 9: Phase-locked loop test methodologies: Current characterization and production test practices
Chapter 10: On-chip testing techniques for RF wireless transceiver systems and components
Chapter 11: Tuning and calibration of analogue, mixed-signal and RF circuits
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