CiNii 図書 - Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach

著者

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach

edited by Yichuang Sun

（IET circuits, devices and systems series, 19）

The Institution of Engineering and Technology, 2008

Includes bibliographical references and index

Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun
Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli
Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He
Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd
DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts
Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan
Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson
Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda
Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson
On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio
Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun