Measurement technology for micro-nanometer devices
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Measurement technology for micro-nanometer devices
John Wiley & Sons, 2017
- : cloth
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Other authors: Xiujian Chou, Tielin Shi, Zongmin Ma, Haifei Bao, Jing Chen, Liguo Chen, Dachao Li, Chenyang Xue
"Published by John Wiley & Sons ... under exclusive license granted by National Defense Industry Press ..."--T.p. verso
Includes bibliographical references and index
