ICDS-20 : proceedings of the 20th International Conference on Defects in Semiconductors, held in Berkeley, CA, USA, 26-30 July 1999

著者

• International Conference on Defects in Semiconductors
• Van de Walle, Chris Gilbert
• Walukiewicz, Wladek

書誌事項

ICDS-20 : proceedings of the 20th International Conference on Defects in Semiconductors, held in Berkeley, CA, USA, 26-30 July 1999

guest editors, Chris Van de Walle, Wladek Walukiewicz

（Physica. B. Condensed matter, v. 273-274）

North-Holland, c1999

詳細情報

• NII書誌ID(NCID): BB25713184
• 出版国コード: ne
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Amsterdam], The Netherlands
• ページ数/冊数: xxv, 1063 p.
• 大きさ: 27 cm
• 親書誌ID:
  • BA10318881