ICDS-20 : proceedings of the 20th International Conference on Defects in Semiconductors, held in Berkeley, CA, USA, 26-30 July 1999

Author(s)

• International Conference on Defects in Semiconductors
• Van de Walle, Chris Gilbert
• Walukiewicz, Wladek

Bibliographic Information

ICDS-20 : proceedings of the 20th International Conference on Defects in Semiconductors, held in Berkeley, CA, USA, 26-30 July 1999

guest editors, Chris Van de Walle, Wladek Walukiewicz

（Physica. B. Condensed matter, v. 273-274）

North-Holland, c1999

Details

• NCID: BB25713184
• Country Code: ne
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: [Amsterdam], The Netherlands
• Pages/Volumes: xxv, 1063 p.
• Size: 27 cm
• Parent Bibliography ID:
  • BA10318881