ICDS-21 : proceedings of the 21st International Conference on Defects in Semiconductors, held in Giessen, Germany, 16-20 July 2001

著者

• International Conference on Defects in Semiconductors
• Hofmann, Detlev M.

書誌事項

ICDS-21 : proceedings of the 21st International Conference on Defects in Semiconductors, held in Giessen, Germany, 16-20 July 2001

guest editor, Detlev M. Hofmann

（Physica. B. Condensed matter, v. 308-310）

North-Holland, c2001

詳細情報

• NII書誌ID(NCID): BB25713253
• 出版国コード: ne
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Amsterdam], The Netherlands
• ページ数/冊数: xxix, 1241 p.
• 大きさ: 27 cm
• 親書誌ID:
  • BA10318881