ICDS-22 : proceedings of the 22nd International Conference on Defects in Semiconductors, held in Aarhus, Denmark, 28 July-1 August 2001

著者

• International Conference on Defects in Semiconductors
• Nielsen, K. Bonde
• Larsen, A. Nylandsted
• Weyer, G

書誌事項

ICDS-22 : proceedings of the 22nd International Conference on Defects in Semiconductors, held in Aarhus, Denmark, 28 July-1 August 2001

guest editors, K. Bonde Nielsen, A. Nylandsted Larsen, G. Weyer

（Physica. B. Condensed matter, v. 340-342）

North-Holland, c2003

詳細情報

• NII書誌ID(NCID): BB25714074
• 出版国コード: ne
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Amsterdam], The Netherlands
• ページ数/冊数: xxv, 1181 p.
• 大きさ: 27 cm
• 親書誌ID:
  • BA10318881