ICDS-23 : proceedings of the 23rd International Conference on Defects in Semiconductors, held in Awaji Island, Japan, 24-29 July 2005

Author(s)

• International Conference on Defects in Semiconductors
• 押山, 淳 オシヤマ, アツシ
• 前田, 康二 マエダ, コウジ
• 伊藤, 公平 イトウ, コウヘイ
• 吉田, 博 ヨシダ, ヒロシ

Bibliographic Information

ICDS-23 : proceedings of the 23rd International Conference on Defects in Semiconductors, held in Awaji Island, Japan, 24-29 July 2005

guest editors, A. Oshiyama...[et al.]

（Physica. B. Condensed matter, v. 376-377）

Elsevier, c2006

Details

• NCID: BB25714507
• Country Code: ne
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: [Amsterdam], The Netherlands
• Pages/Volumes: xxiii, 987 p.
• Size: 28 cm
• Parent Bibliography ID:
  • BA10318881