Logic & memory experiments using TTL integrated circuits

Author(s)

• Larsen, David G
• Rony, Peter R.

Bibliographic Information

Logic & memory experiments using TTL integrated circuits

by David G. Larsen and Peter R. Rony

（Blacksburg continuing education series）

H. W. Sams, c1978-1979

• 1
• 2

Note

Bibliography: v. 1, p. 343-344

Includes index

Authors names reversed on v. 2

Details

• NCID: BB25775840
• ISBN:
  • 067221542X
  • 0672215438
• LCCN: 78057209
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Indianapolis
• Pages/Volumes: 2 v.
• Size: 22 cm
• Classification:
  • LCC : TK7868.D5
  • DC : 621.3819/5835
• Subject Headings:
  • LCSH : Digital electronics -- Experiments
  • LCSH : Transistor-transistor logic circuits -- Experiments
  • LCSH : Computer storage devices -- Experiments
  • LCSH : Integrated circuits -- Experiments
• Parent Bibliography ID:
  • BA11263810