2017 IEEE International Test Conference : (ITC 2017) : Forth [i.e. Fort] Worth, Texas, USA 31 October-2 November 2017

Author(s)

• International Test Conference
• Institute of Electrical and Electronics Engineers

Bibliographic Information

2017 IEEE International Test Conference : (ITC 2017) : Forth [i.e. Fort] Worth, Texas, USA 31 October-2 November 2017

IEEE, c2017

Other Title

CFP17ITC-POD

Note

"IEEE catalog number: CFP17ITC-POD"

Includes bibliographical references and index

Details

• NCID: BB25958578
• ISBN:
  • 9781538634141
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, NJ
• Pages/Volumes: 485 p.
• Size: 28 cm