{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BB26111824.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BB26111824#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BB26111824.json"},"dc:title":[{"@value":"2017 IEEE International Conference on Image Processing (ICIP 2017) : Beijing, China 17-20 September 2017"}],"dcterms:alternative":["CFP17CIP-POD"],"dc:publisher":[{"@value":"IEEE"}],"dcterms:extent":"6 v. (xcv, 4595 p.)","cinii:size":"28 cm","dc:language":"eng","dc:date":"2017","cinii:ncid":"BB26111824","cinii:ownerCount":"1","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA09364968#entity","@type":"foaf:Person","foaf:name":[{"@value":"IEEE International Conference on Image Processing"}]},{"@id":"https://ci.nii.ac.jp/author/DA00739948#entity","@type":"foaf:Person","foaf:name":[{"@value":"Institute of Electrical and Electronics Engineers"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA005642","@type":"foaf:Organization","foaf:name":"拓殖大学 八王子図書館","rdfs:seeAlso":{"@id":"https://opac.lib.takushoku-u.ac.jp/opac/search?target=local&searchmode=complex&autoDetail=true&s_ncid=BB26111824"}}],"prism:publicationDate":["c2017"],"cinii:note":["\"IEEE catalog number: CFP17CIP-POD\"","Includes bibliographical references and index"],"dcterms:hasPart":[{"@id":"urn:isbn:9781509021765","dc:title":": [set]"},{"dc:title":"p. 1-764"},{"dc:title":"p. 765-1531"},{"dc:title":"p. 1532-2298"},{"dc:title":"p. 2299-3065"},{"dc:title":"p. 3066-3829"},{"dc:title":"p. 3830-4595"}]}]}