Progress in nanoscale characterization and manipulation
Author(s)
Bibliographic Information
Progress in nanoscale characterization and manipulation
(Springer tracts in modern physics : Ergebnisse der exakten Naturwissenschaften / editor, G. Höhler, v. 272)
Springer, c2018 , Peking University Press, c2018
Available at / 6 libraries
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The Institute for Solid State Physics Library. The University of Tokyo.図書室
420.8:S1:2727210385113
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Note
Other editors: Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai
"Jointly published with Peking University Press, Beijing, China"--T.p. verso
Includes bibliographical references
Description and Table of Contents
Description
This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.
The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
Table of Contents
Electron/Ion Optics.- Scanning Electron Microscopy.- Transmission Electron Microscopy.- Scanning Transmission Electron Microscopy (STEM).- Spectroscopy.- Aberration Corrected Transmission Electron Microscopy and Its Applications.- In situ TEM: Theory and Applications.- Helium Ion Microscopy.
by "Nielsen BookData"