Progress in nanoscale characterization and manipulation
著者
書誌事項
Progress in nanoscale characterization and manipulation
（Springer tracts in modern physics : Ergebnisse der exakten Naturwissenschaften / editor, G. Höhler, v. 272）
Springer, c2018 , Peking University Press, c2018
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注記
Other editors: Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai
"Jointly published with Peking University Press, Beijing, China"--T.p. verso
Includes bibliographical references
内容説明・目次
内容説明
This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.
The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
目次
Electron/Ion Optics.- Scanning Electron Microscopy.- Transmission Electron Microscopy.- Scanning Transmission Electron Microscopy (STEM).- Spectroscopy.- Aberration Corrected Transmission Electron Microscopy and Its Applications.- In situ TEM: Theory and Applications.- Helium Ion Microscopy.
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