Ellipsometry of functional organic surfaces and films

著者

    • Hinrichs, Karsten
    • Eichhorn, Klaus-Jochen

書誌事項

Ellipsometry of functional organic surfaces and films

Karsten Hinrichs, Klaus-Jochen Eichhorn, editors

(Springer series in surface sciences, v. 52)

Springer, c2018

2nd ed

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注記

Includes bibliographical references and index

内容説明・目次

内容説明

This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years. The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.

目次

Indtroduction.- Ellipsometry: A survey of Concept.- Biomolecules at surfaces.- Smart polymer surfaces and films.- Nanostructured surfaces and organic/inorganic hybrids.- Thin films of organic semiconductors for OPV, OLEDs and OTFT.- Developments in ellipsometric real-time/in-situ monitoring techniques.- Infrared spectroscopic methods for characterization of thin organic films.- Brillant infrared light sources for micro-ellipsometric studies of organic films.- Optical constants.

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詳細情報

  • NII書誌ID(NCID)
    BB27066678
  • ISBN
    • 9783319758947
  • LCCN
    2018932173
  • 出版国コード
    sz
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Cham
  • ページ数/冊数
    xxvi, 547 p.
  • 大きさ
    25 cm
  • 分類
  • 親書誌ID
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