Beyond the implant : retrieval analysis methods for implant surveillance

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Beyond the implant : retrieval analysis methods for implant surveillance

editors: William M. Mihalko ... [et al.]

(Selected technical papers, 1606)

ASTM International, c2018

  • : pbk

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STP1606

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Note

Other editors: Jack E. Lemons, A. Seth Greenwald, Steven M. Kurtz

"ASTM stock #STP1606"--T.p.

"THIS COMPILATION OF Selected Technical Papers, STP1606, Beyond the Implant : Retrieval Analysis Methods for Implant Surveillance, contains peer-reviewed papers that were presented at a symposium held May 9, 2017, in Toronto, Ontario, Canada. The symposium was sponsored by ASTM International Committee F04 on Medical and Surginal Materials and Devices, and Subcommittee F04.22 on Arthroplasty."--Foreword

Includes bibliographical references

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