VLSI design and test for systems dependability

Author(s)

• Asai, Shojiro

Bibliographic Information

VLSI design and test for systems dependability

Shojiro Asai editor

Springer, c2019

Details

• NCID: BB27514542
• ISBN:
  • 9784431565925
• Country Code: ja
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Tokyo
• Pages/Volumes: xvii, 800 p.
• Size: 25 cm
• Classification:
  • DC23 : 621.395
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration