Chemical mechanical polishing 2000 -- fundamentals and materials issues : symposium held April 26-27, 2000, San Francisco, California, U.S.A.

Author(s)

    • Singh, Rajiv K
    • Bajaj, Rajeev
    • Moinpour, Mansour
    • Meuris, Marc

Bibliographic Information

Chemical mechanical polishing 2000 -- fundamentals and materials issues : symposium held April 26-27, 2000, San Francisco, California, U.S.A.

editors, Rajiv K. Singh ... [et al.]

(Materials Research Society symposium proceedings, v. 613)

Materials Research Society , Cambridge University Press, 2013

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Note

Includes bibliographical references and indexes

"First paperback edition 2013"--T.p. verso

Description and Table of Contents

Description

Chemical-mechanical polishing (CMP) is a critical technology in the planarization of multilevel metallization systems and shallow-trench isolation in semiconductor manufacturing. Other emerging applications for this technology include flat-panel displays, magnetic data storage and microelectromechanical systems. The rapid emergence of copper as the conducting material for integrated circuits has further pushed CMP technology to the forefront of semiconductor manufacturing. However, a basic understanding of the CMP process, which is necessary to enable further advances, is inadequate. This book, first published in 2001, provides an insight into the fundamental processes in CMP. Presentations from academia, government institutions and industry are featured. Topics include: CMP mechanisms; dielectric and metal CMP; process integration and manufacturability; and CMP consumables.

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Details

  • NCID
    BB2767463X
  • ISBN
    • 9781107413146
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Warrendale, PA,Cambridge ; New York
  • Pages/Volumes
    1 v.
  • Size
    23 cm
  • Parent Bibliography ID
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