{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BB28656983.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BB28656983#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BB28656983.json"},"dc:title":[{"@value":"Semiconductor radiation detectors"}],"dc:creator":"Alan Owens","dc:publisher":[{"@value":"CRC Press"}],"dcterms:extent":"xxiii, 494 p.","cinii:size":"29 cm","dc:language":"eng","dc:date":"2019","cinii:ncid":"BB28656983","cinii:ownerCount":"2","foaf:maker":[{"@type":"foaf:Person","foaf:name":[{"@value":"Owens, Alan"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA013061","@type":"foaf:Organization","foaf:name":"川崎医療福祉大学 附属図書館","rdfs:seeAlso":{"@id":"https://library.kawasaki-m.ac.jp/opac/search?target=local&searchmode=complex&autoDetail=true&s_ncid=BB28656983"}},{"@id":"https://ci.nii.ac.jp/library/FA016922","@type":"foaf:Organization","foaf:name":"高知工科大学 附属情報図書館","rdfs:seeAlso":{"@id":"https://www-opac.lib.kppuc.ac.jp/mylimedio/search/search.do?target=local&mode=comp&category-mgz=1&category-book=1&annex=all&ncid=BB28656983"}}],"bibo:lccn":["2012000808"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/2012000808"}],"prism:publicationDate":["c2019"],"cinii:note":["Includes bibliographical references and index"],"dc:subject":["LCC:QC481.5","DC23:537.5/352"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=X-rays+--+Measurement+--+Materials","dc:title":"X-rays -- Measurement -- Materials"},{"@id":"https://ci.nii.ac.jp/books/search?q=Gamma+ray+detectors+--+Materials","dc:title":"Gamma ray detectors -- Materials"},{"@id":"https://ci.nii.ac.jp/books/search?q=X-ray+diffractometer+--+Materials","dc:title":"X-ray diffractometer -- Materials"},{"@id":"https://ci.nii.ac.jp/books/search?q=Compound+semiconductors","dc:title":"Compound semiconductors"},{"@id":"https://ci.nii.ac.jp/books/search?q=SCIENCE+%2F+Physics+bisacsh","dc:title":"SCIENCE / Physics bisacsh"},{"@id":"https://ci.nii.ac.jp/books/search?q=TECHNOLOGY+%26+ENGINEERING+%2F+Material+Science+bisacsh","dc:title":"TECHNOLOGY & ENGINEERING / Material Science bisacsh"},{"@id":"https://ci.nii.ac.jp/books/search?q=TECHNOLOGY+%26+ENGINEERING+%2F+Sensors+bisacsh","dc:title":"TECHNOLOGY & ENGINEERING / Sensors bisacsh"}],"dcterms:isPartOf":[{"@id":"https://ci.nii.ac.jp/ncid/BB07718426#entity","dc:title":"Series in sensors","@type":"bibo:Book"}],"dcterms:hasPart":[{"@id":"urn:isbn:9781138070745","dc:title":": hbk"}]}]}