Electrical atomic force microscopy for nanoelectronics

Author(s)

• Celano, Umberto

Bibliographic Information

Electrical atomic force microscopy for nanoelectronics

Umberto Celano, editor

（Nanoscience and technology）

Springer, c2019

Note

Includes bibliographical references

Details

• NCID: BB28823349
• ISBN:
  • 9783030156114
• Country Code: sz
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Cham
• Pages/Volumes: xx, 408 p.
• Size: 25 cm
• Classification:
  • DC23 : 537
• Subject Headings:
  • LCSH : Electromagnetism
• Parent Bibliography ID:
  • BA33734375