Theory and methods of photovoltaic material characterization : optical and electrical measurement techniques

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書誌事項

Theory and methods of photovoltaic material characterization : optical and electrical measurement techniques

Richard K. Ahrenkiel, S. Phillip Ahrenkiel

(World scientific series in materials and energy / series editor, Leonard C. Feldman, v. 13)

World Scientific, c2019

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注記

Includes bibliographical references and index

内容説明・目次

内容説明

This book provides an extensive review of the theory of transport and recombination properties in semiconductors. The emphasis is placed on electrical and optical techniques. There is a presentation of the latest experimental and theoretical techniques used to analyze minority-carrier lifetime. The relevant hardware and instrumentation are described. The newest techniques of lifetime mapping are presented. The issues are discussed relating to effects that mask carrier lifetime in certain device structures. The discrepancy between photoconductive and photoluminescence measurement results are analyzed.

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詳細情報

  • NII書誌ID(NCID)
    BB28899500
  • ISBN
    • 9789813277090
  • 出版国コード
    si
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Singapore
  • ページ数/冊数
    xiv, 310 p.
  • 大きさ
    24 cm
  • 親書誌ID
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