Ion beam surface layer analysis : proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation

著者

• International Conference on Ion Beam Surface Layer Analysis
• Mayer, James W.
• Ziegler, J. F.

書誌事項

Ion beam surface layer analysis : proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation

edited by James W. Mayer and James F. Ziegler

Elsevier Sequoia S.A., 1974

注記

"These proceedings were originally published in Thin solid films." -- T.p.

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BB29123739
• ISBN:
  • 044419536X
• LCCN: 74000348
• 出版国コード: sz
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Lausanne
• ページ数/冊数: viii, 463 p
• 大きさ: 25 cm
• 分類:
  • LCC : QC176.82
  • DC : 541/.3453
• 件名:
  • LCSH : Thin films -- Congresses