Ion beam surface layer analysis : proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation

Author(s)

• International Conference on Ion Beam Surface Layer Analysis
• Mayer, James W.
• Ziegler, J. F.

Bibliographic Information

Ion beam surface layer analysis : proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation

edited by James W. Mayer and James F. Ziegler

Elsevier Sequoia S.A., 1974

Note

"These proceedings were originally published in Thin solid films." -- T.p.

Includes bibliographical references

Details

• NCID: BB29123739
• ISBN:
  • 044419536X
• LCCN: 74000348
• Country Code: sz
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Lausanne
• Pages/Volumes: viii, 463 p
• Size: 25 cm
• Classification:
  • LCC : QC176.82
  • DC : 541/.3453
• Subject Headings:
  • LCSH : Thin films -- Congresses