Next generation HALT and HASS : robust design of electronics and systems

著者

    • Gray, Kirk A.
    • Paschkewitz, John James

書誌事項

Next generation HALT and HASS : robust design of electronics and systems

Kirk A. Gray, John J. Paschkewitz

(Wiley series in quality and reliability engineering)

Wiley, 2016

  • : cloth

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注記

Includes bibliographical references and index

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