Machine vision applications in industrial inspection XV : 29-30 January 2007, San Jose, California, USA

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書誌事項

Machine vision applications in industrial inspection XV : 29-30 January 2007, San Jose, California, USA

Fabrice Meriaudeau, Kurt S. Niel, editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 6503）

SPIE , IS&T, c2007

タイトル別名

Proceedings of Electronic Imaging Science and Technology

Machine vision applications in industrial inspection 15

Machine vision applications in industrial inspection fifteen

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注記

Includes bibliographical references and author index

SPIE Vol. 6503

内容説明・目次

内容説明

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

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    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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