Advances in imaging and electron physics

著者

• Hÿtch, Martin
• Hawkes, P. W. (Peter William)

書誌事項

Advances in imaging and electron physics

edited by Martin Hÿtch and Peter W. Hawkes

Academic Press, c2020

• v. 215

注記

Includes bibliographical references and index

内容説明・目次

内容説明

Advances in Imaging and Electron Physics, Volume 215, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

目次

1. Intensity interferometry experiment: photon bunching in cathodoluminescence Sophie Meuret 2. Applications of photon bunching in cathodoluminescence Sophie Meuret 3. A quantum propagator for electrons in a round magnetic lens Stefan Loeffler, Ann-Lenaig Hamon, Denis Aubry, Peter Schattschneider 4. Progress in determining of compound composition by BSE imaging in a SEM and the relevant detector disadvantages V.G. Dyukova, S.A. Nepijko 5. A new paradigm for FDM: cylindrically symmetric electrostatics David Edwards Jr 6. Solutions of the Laplace equation in cylindrical coordinates, driven to 2D harmonic potentials Igor F. Spivak-Lavrov, Telektes Zh. Shugaeva, Samat U. Sharipov 7. Characteristics of triode electron guns R. Lauer

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詳細情報

• NII書誌ID(NCID): BC02066959
• ISBN:
  • 9780128210017
• 出版国コード: uk
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: London
• ページ数/冊数: xii, 270 p.
• 大きさ: 24 cm