Scanning nonlinear dielectric microscopy : investigation of ferroelectric, dielectric, and semiconductor materials and devices
Author(s)
Bibliographic Information
Scanning nonlinear dielectric microscopy : investigation of ferroelectric, dielectric, and semiconductor materials and devices
（Woodhead Publishing series in electronic and optical materials）
Woodhead Publishing, An imprint of Elsevier, c2020
- : pbk
Available at / 3 libraries
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Institute of Materials and Systems for Sustainability, Nagoya University未来材料研
: pbk549.97||C41690959
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Note
Includes bibliographical references and index
Description and Table of Contents
Description
Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials.
The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.
Table of Contents
1. Principals of scanning nonlinear dielectric microscopy for measuring ferroelectric and dielectric polarization 2. Ferroelectric polarization measurement 3. Three-dimensional polarization measurement 4. Ultra high-density ferroelectric data storage using scanning nonlinear dielectric microscopy 5. Linear permittivity measurement by scanning nonlinear dielectric microscopy 6. Noncontact scanning nonlinear dielectric microscopy 7. Scanning nonlinear dielectric potentiometry for measurement of the potential induced by atomic dipole measurements 8. Principles of scanning nonlinear dielectric microscopy for semiconductor measurements 9. Carrier distribution measurement in semiconductor materials and devices 10. Super-higher-order scanning nonlinear dielectric microscopy 11. Local deep-level transient spectroscopy 12. Time-resolved scanning nonlinear dielectric microscopy
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