Scanning nonlinear dielectric microscopy : investigation of ferroelectric, dielectric, and semiconductor materials and devices
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Bibliographic Information
Scanning nonlinear dielectric microscopy : investigation of ferroelectric, dielectric, and semiconductor materials and devices
（Woodhead Publishing series in electronic and optical materials）
Woodhead Publishing, An imprint of Elsevier, c2020
- : pbk
Available at / 3 libraries
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Institute of Materials and Systems for Sustainability, Nagoya University未来材料研
: pbk549.97||C41690959
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Includes bibliographical references and index
