Proceedings : ATFA-78 : advanced techniques in failure analysis, 6-9 November 1978, Airport Marriott Hotel, Los Angeles, California USA : proceedings

著者

• Institute of Electrical and Electronics Engineers
• Institute of Electrical and Electronics Engineers. Los Angeles Council

書誌事項

Proceedings : ATFA-78 : advanced techniques in failure analysis, 6-9 November 1978, Airport Marriott Hotel, Los Angeles, California USA : proceedings

sponsored by the Institute of Electrical and Electronics Engineers, Inc., (IEEE) Los Angeles Council, Region 6

Institute of Electrical and Electronics Engineers, c1978

タイトル別名

AFTA 78

ATFA-78 : advanced techniques in failure analysis

78CH1407-6 Reg6

78CH14076

注記

"IEEE catalog no. 78CH1407-6 Reg. 6."

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BC02536815
• LCCN: 81184947
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York, NY
• ページ数/冊数: vii, 200 p.
• 大きさ: 29 cm
• 分類:
  • LCC : TK7870.2
  • DC19 : 621.381/028/7
• 件名:
  • LCSH : Electronic apparatus and appliances -- Testing -- Congresses
  • LCSH : Semiconductors -- Testing -- Congresses