Autotestcon '78 : International Automatic Testing Conference : conference record

Author(s)

• Autotestcon
• Institute of Electrical and Electronics Engineers
• Institute of Electrical and Electronics Engineers. San Diego Section
• IEEE Aerospace and Electronic Systems Society
• IEEE Instrumentation and Measurement Society
• American Institute of Aeronautics and Astronautics

Bibliographic Information

Autotestcon '78 : International Automatic Testing Conference : conference record

sponsored by the Institute of Electrical and Electronics Engineers ... [et al.]

Institute of Electrical and Electronics Engineers, c1978

Other Title

IEEE 1978 Autotestcon

78CH1416-7 AES

78CH14167

Note

"IEEE Publication 78CH1416-7 AES"

Includes bibliographies

Details

• NCID: BC02537341
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York, NY
• Pages/Volumes: viii, 405 p.
• Size: 29 cm
• Subject Headings:
  • LCSH : Automatic checkout equipment -- Congresses