Noise and fluctuations in circuits, devices, and materials : 21-24 May 2007, Florence, Italy

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Noise and fluctuations in circuits, devices, and materials : 21-24 May 2007, Florence, Italy

Massimo Macucci ... [et al.], editors ; sponsored and published by SPIE ; cooperating organizations, EOS--European Optical Society, SIOF (Italy), SPIE Europe

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 6600）

SPIE, c2007

  • : pbk

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Includes bibliographical references and author index

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  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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