Optical measurement systems for industrial inspection V : 18-22 June 2007, Munich, Germany

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書誌事項

Optical measurement systems for industrial inspection V : 18-22 June 2007, Munich, Germany

Wolfgang Osten, Christophe Gorecki, Erik L. Novak, editors ; sponsored by SPIE Europe ; cooperating organizations, EOS--European Optical Society, WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany)

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 6616）

SPIE, c2007

  • : pt. 1

タイトル別名

Optical measurement systems for industrial inspection 5

Optical measurement systems for industrial inspection five

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注記

Includes bibliographical references and author index

"Part One of Two Parts"--T.p.

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  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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