Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA

Author(s)

• Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies
• Duparré, Angela
• Singh, Bhanwar
• Gu, Zu-Han
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA

Angela Duparré, Bhanwar Singh, Zu-Han Gu, editors ; sponsored and published by SPIE

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 6672）

SPIE, c2007

Other Title

Advanced characterization techniques for optics, semiconductors, and nanotechnologies 3

Advanced characterization techniques for optics, semiconductors, and nanotechnologies three

Note

Includes bibliographical references and author index

Details

• NCID: BC03122261
• ISBN:
  • 9780819468208
• LCCN: 2010287972
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: 1 v. (various pagings)
• Size: 28 cm
• Classification:
  • LCC : TA1750
• Subject Headings:
  • LCSH : Optoelectronics -- Congresses
  • LCSH : Optoelectronic devices -- Congresses
  • LCSH : Optical measurements -- Congresses
  • LCSH : Semiconductors -- Characterization -- Congresses
  • LCSH : Thin films -- Optical properties -- Congresses
  • LCSH : Nanotechnology -- Congresses
• Parent Bibliography ID:
  • BA0022700X