Time and frequency metrology : 29-30 August 2007, San Diego, California, USA
著者
書誌事項
Time and frequency metrology : 29-30 August 2007, San Diego, California, USA
(Proceedings / SPIE -- the International Society for Optical Engineering, v. 6673)
SPIE, c2007
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注記
Includes bibliographical references and author index
内容説明・目次
内容説明
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
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