Autotestcon '82, October 12-14 : "the keys to cost reduction" : 1982 IEEE International Automatic Testing Conference, Dayton Convention Center, Dayton, Ohio

著者

• Autotestcon
• Institute of Electrical and Electronics Engineers
• Institute of Electrical and Electronics Engineers. Dayton Section
• IEEE Aerospace and Electronic Systems Society
• IEEE Instrumentation and Measurement Society
• American Institute of Aeronautics and Astronautics

書誌事項

Autotestcon '82, October 12-14 : "the keys to cost reduction" : 1982 IEEE International Automatic Testing Conference, Dayton Convention Center, Dayton, Ohio

sponsored by the Institute of Electrical and Electronics Engineers ... [et al.]

Institute of Electrical and Electronics Engineers, c1982

タイトル別名

IEEE 1982 Autotestcon

1982 IEEE International Automatic Testing Conference, Dayton, Ohio, October 12-14, 1982

82CH1786-3

82CH17863

注記

"82CH1786-3"

詳細情報

• NII書誌ID(NCID): BC03605946
• LCCN: 82082106
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York, NY
• ページ数/冊数: ix, 590 p.
• 大きさ: 28 cm
• 件名:
  • LCSH : Automatic checkout equipment -- Congresses