Autotestcon '82, October 12-14 : "the keys to cost reduction" : 1982 IEEE International Automatic Testing Conference, Dayton Convention Center, Dayton, Ohio

Author(s)

• Autotestcon
• Institute of Electrical and Electronics Engineers
• Institute of Electrical and Electronics Engineers. Dayton Section
• IEEE Aerospace and Electronic Systems Society
• IEEE Instrumentation and Measurement Society
• American Institute of Aeronautics and Astronautics

Bibliographic Information

Autotestcon '82, October 12-14 : "the keys to cost reduction" : 1982 IEEE International Automatic Testing Conference, Dayton Convention Center, Dayton, Ohio

sponsored by the Institute of Electrical and Electronics Engineers ... [et al.]

Institute of Electrical and Electronics Engineers, c1982

Other Title

IEEE 1982 Autotestcon

1982 IEEE International Automatic Testing Conference, Dayton, Ohio, October 12-14, 1982

82CH1786-3

82CH17863

Note

"82CH1786-3"

Details

• NCID: BC03605946
• LCCN: 82082106
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York, NY
• Pages/Volumes: ix, 590 p.
• Size: 28 cm
• Subject Headings:
  • LCSH : Automatic checkout equipment -- Congresses