Atom probe tomography : analysis at the atomic level

Author(s)

• Miller, M. K. (Michael Kenneth)

Bibliographic Information

Atom probe tomography : analysis at the atomic level

M. K. Miller

Springer Science + Business Media, c2000

Note

Includes bibliographical references and index

"Originally published by Kluwer Academic/Plenum Publishers, New York in 2000" -- T.p. verso

Details

• NCID: BC03678961
• ISBN:
  • 9781461369219
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: xiv, 239 p.
• Size: 24 cm
• Classification:
  • LCC : QH212.A76M56
  • DC21 : 502/.8/2
  • NDC9 : 429.2
• Subject Headings:
  • LCSH : Atom-probe field ion microscopy
  • LCSH : Tomography