Proceedings, Autotestcon 86, San Antonio, TX, September 8-11, 1986 : IEEE International Automatic Testing Conference, Henry B. Gonzalez Convention Center, San Antonio, Texas : "advancin test concepts and the user"

著者

• Autotestcon
• Institute of Electrical and Electronics Engineers
• IEEE Aerospace and Electronic Systems Society
• IEEE Instrumentation and Measurement Society
• Institute of Electrical and Electronics Engineers. Austin/San Antonio Section

書誌事項

Proceedings, Autotestcon 86, San Antonio, TX, September 8-11, 1986 : IEEE International Automatic Testing Conference, Henry B. Gonzalez Convention Center, San Antonio, Texas : "advancin test concepts and the user"

sponsored by the Institute of Electrical and Electronics Engineers ... [et al.]

Order Dept. IEEE, c1986

タイトル別名

IEEE 1986 Autotestcon

Proceedings of 1986 IEEE International Automatic Testing Conference, San Antonio, Texas, September 8-11, 1986

Advancin test concepts and the user

86CH2299-6

86CH22996

注記

IEEE catalog number: 86CH2299-6

詳細情報

• NII書誌ID(NCID): BC0404358X
• LCCN: 86080390
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, NJ
• ページ数/冊数: xiii, 415 p.
• 大きさ: 28 cm
• 件名:
  • LCSH : Automatic checkout equipment -- Congresses