Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium : February 10-12, 1988, Holiday Inn Embarcadero, San Diego, CA, USA

Author(s)

• IEEE Semiconductor Thermal and Temperature Measurement Symposium
• IEEE Components, Hybrids, and Manufacturing Technology Society
• Institute of Electrical and Electronics Engineers

Bibliographic Information

Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium : February 10-12, 1988, Holiday Inn Embarcadero, San Diego, CA, USA

[sponsored by IEEE Components, Hybrids, and Manufacturing Technology Society]

Institute of Electrical and Electronics Engineers , additional copies of this proceedings may be purchased from IEEE Service Center, c1988

Other Title

1988 IEEE Fourth Annual Semiconductor Thermal & Temperature Measurement Symposium

1988 proceedings, Fourth IEEE Semiconductor Thermal and Temperature Measurement Symposium

4th Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium, February 10-12, 1988, San Diego, CA, USA

Fourth SEMI-THERM

1988 SEMI-THERM

88CH2530-4

88CH25304

Note

IEEE Catalog Number 88CH2530-4

• NCID: BC04273240
• LCCN: 87083248
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York, NY,Piscataway, NJ
• Pages/Volumes: 158 p.
• Size: 28 cm