Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures, ICMTS, Long Beach Hyatt Regency, Long Beach, California, February 22-23, 1988

著者

• IEEE International Conference on Microelectronic Test Structures
• IEEE Electron Devices Society

書誌事項

Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures, ICMTS, Long Beach Hyatt Regency, Long Beach, California, February 22-23, 1988

sponsored by IEEE Electron Devices Society

Institute of Electrical and Electronics Engineers, c1988

タイトル別名

1988 IEEE International Conference on Microelectronic Test Structures

1988 IEEE proceedings on microelectronic test structures, vol. 1, no. 1, Feb. 1988

1988 IEEE proceedings on Microelectronic Test Structures

1988 IEEE International Conference on Microelectronic Test Structures (ICMTS), Long Beach Hyatt Regency, Long Beach, California, February 22-23, 1988

1988 ICMTS

88CH2560-1

88CH25601

注記

"88CH2560-01"

"February 1988, volume-1, CH2560-01"--p.i (contents page)

詳細情報

• NII書誌ID(NCID): BC04275891
• LCCN: 8783668
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York, NY
• ページ数/冊数: v, 206 p.
• 大きさ: 28 cm
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses