Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures, ICMTS, Long Beach Hyatt Regency, Long Beach, California, February 22-23, 1988

Author(s)

• IEEE International Conference on Microelectronic Test Structures
• IEEE Electron Devices Society

Bibliographic Information

Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures, ICMTS, Long Beach Hyatt Regency, Long Beach, California, February 22-23, 1988

sponsored by IEEE Electron Devices Society

Institute of Electrical and Electronics Engineers, c1988

Other Title

1988 IEEE International Conference on Microelectronic Test Structures

1988 IEEE proceedings on microelectronic test structures, vol. 1, no. 1, Feb. 1988

1988 IEEE proceedings on Microelectronic Test Structures

1988 IEEE International Conference on Microelectronic Test Structures (ICMTS), Long Beach Hyatt Regency, Long Beach, California, February 22-23, 1988

1988 ICMTS

88CH2560-1

88CH25601

Note

"88CH2560-01"

"February 1988, volume-1, CH2560-01"--p.i (contents page)

• NCID: BC04275891
• LCCN: 8783668
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York, NY
• Pages/Volumes: v, 206 p.
• Size: 28 cm
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses