Imaging and illumination for metrology and inspection : 2-4 November 1994, Boston, Massachusetts

Author(s)

• Svetkoff, Donald J.
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Imaging and illumination for metrology and inspection : 2-4 November 1994, Boston, Massachusetts

Donald J. Svetkoff, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 2348）

SPIE, c1995

Note

Includes bibliographical references and author index

Details

• NCID: BC04925410
• ISBN:
  • 0819416835
• LCCN: 94067545
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: vii, 276 p.
• Size: 28 cm
• Classification:
  • LCC : TA1634
  • DC20 : 670.42/5
• Subject Headings:
  • LCSH : Computer vision -- Congresses
  • LCSH : Optical detectors -- Congresses
  • LCSH : Interferometry -- Congresses
  • LCSH : Three-dimensional imaging -- Congresses
• Parent Bibliography ID:
  • BA0022700X