Imaging and illumination for metrology and inspection : 2-4 November 1994, Boston, Massachusetts

著者

• Svetkoff, Donald J.
• Society of Photo-optical Instrumentation Engineers

書誌事項

Imaging and illumination for metrology and inspection : 2-4 November 1994, Boston, Massachusetts

Donald J. Svetkoff, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 2348）

SPIE, c1995

注記

Includes bibliographical references and author index

• NII書誌ID(NCID): BC04925410
• ISBN:
  • 0819416835
• LCCN: 94067545
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: vii, 276 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TA1634
  • DC20 : 670.42/5
• 件名:
  • LCSH : Computer vision -- Congresses
  • LCSH : Optical detectors -- Congresses
  • LCSH : Interferometry -- Congresses
  • LCSH : Three-dimensional imaging -- Congresses
• 親書誌ID:
  • BA0022700X