{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BC0497704X.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BC0497704X#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BC0497704X.json"},"dc:title":[{"@value":"High-stakes testing in education : value, fairness and consequences"}],"dc:creator":"edited by Theo J.H.M. Eggen and Gordon Stobart","dc:publisher":[{"@value":"Routledge"}],"dcterms:extent":"xi, 142 p.","cinii:size":"26 cm","dc:language":"eng","dc:date":"2014","cinii:ncid":"BC0497704X","cinii:ownerCount":"2","foaf:maker":[{"@type":"foaf:Person","foaf:name":[{"@value":"Eggen, Theo J. H. M."}]},{"@id":"https://ci.nii.ac.jp/author/DA02706258#entity","@type":"foaf:Person","foaf:name":[{"@value":"Stobart, G."}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA005686","@type":"foaf:Organization","foaf:name":"中央大学 図書館 理工学部分館","rdfs:seeAlso":{"@id":"https://opac.library.chuo-u.ac.jp/"}},{"@id":"https://ci.nii.ac.jp/library/FA008913","@type":"foaf:Organization","foaf:name":"福岡大学 図書館","rdfs:seeAlso":{"@id":"https://fuopac.lib.fukuoka-u.ac.jp/opac/opac_openurl/?ncid=BC0497704X"}}],"prism:publicationDate":["2014"],"dc:subject":["DC23:371.26","DC20:371.26013"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Educational+tests+and+measurements+--+Evaluation","dc:title":"Educational tests and measurements -- Evaluation"}],"dcterms:hasPart":[{"@id":"urn:isbn:9781138775565"}]}]}