Quantitative atomic-resolution electron microscopy

著者

• De Backer, Annick
• Hÿtch, Martin
• Hawkes, Peter W.

書誌事項

Quantitative atomic-resolution electron microscopy

Annick De Backer ... [et al.] ; edited by Martin Hÿtch and Peter W. Hawkes

（Advances in imaging and electron physics, v. 217）

Academic Press, c2021

注記

Includes bibliographical references (p. 255-278) and index

内容説明・目次

内容説明

Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.

目次

1. Introduction Sandra Van Aert 2. Statistical parameter estimation theory Sandra Van Aert 3. Efficient fitting algorithm Sandra Van Aert 4. Statistics-based atom counting Sandra Van Aert 5. Atom column detection Sandra Van Aert 6. Optimal experiment design for nanoparticle atom-counting from ADF STEM images Sandra Van Aert 7. Maximum a posteriori probability Sandra Van Aert 8. Discussion and conclusions Sandra Van Aert 9. Phase retrieval methods applied to coherent imaging Tatiana Latychevskaia

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詳細情報

• NII書誌ID(NCID): BC05602960
• ISBN:
  • 9780128246078
• 出版国コード: uk
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: London
• ページ数/冊数: xi, 282 p.
• 大きさ: 24 cm
• 分類:
  • DC23 : 502.825
• 件名:
  • LCSH : Electron microscopy
  • LCSH : Stereology
• 親書誌ID:
  • BC03122013