International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics : [proceedings] 11-13 May, 1995, Kiev, Ukraine

Author(s)

• International Workshop on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
• Svechnikov, Sergeĭ Vasilʹevich
• Valakh, M. I︠A︡. (Mikhail I︠A︡kovlevich)
• SPIE Ukraine Chapter
• International Association of the Academies of Sciences
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics : [proceedings] 11-13 May, 1995, Kiev, Ukraine

Sergey V. Svechnikov, Mikhail Ya. Valakh, chairs/editors ; organized by SPIE Ukraine Chapter ... [et al.] ; sponsored by International Association of the Academies of Sciences ... [et al.] ; published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 2648）

SPIE, c1995

Other Title

Optical diagnostics of materials and devices for opto-, micro-, and quantum electronics

Note

Includes bibliographic references and author index

Details

• NCID: BC06605068
• ISBN:
  • 0819420212
• LCCN: 95071190
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: xv, 768 p.
• Size: 28 cm
• Classification:
  • LCC : TK7871
  • DC21 : 621.36
• Subject Headings:
  • LCSH : Electronics -- Materials -- Optical properties -- Congresses
  • LCSH : Electronics -- Materials -- Testing -- Congresses
  • LCSH : Optoelectronics -- Materials -- Optical properties -- Congresses
  • LCSH : Microelectronics -- Materials -- Optical properties -- Congresses
  • LCSH : Quantum electronics -- Materials -- Optical properties -- Congresses
• Parent Bibliography ID:
  • BA0022700X