International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics : [proceedings] 11-13 May, 1995, Kiev, Ukraine

著者

• International Workshop on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
• Svechnikov, Sergeĭ Vasilʹevich
• Valakh, M. I︠A︡. (Mikhail I︠A︡kovlevich)
• SPIE Ukraine Chapter
• International Association of the Academies of Sciences
• Society of Photo-optical Instrumentation Engineers

書誌事項

International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics : [proceedings] 11-13 May, 1995, Kiev, Ukraine

Sergey V. Svechnikov, Mikhail Ya. Valakh, chairs/editors ; organized by SPIE Ukraine Chapter ... [et al.] ; sponsored by International Association of the Academies of Sciences ... [et al.] ; published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 2648）

SPIE, c1995

タイトル別名

Optical diagnostics of materials and devices for opto-, micro-, and quantum electronics

注記

Includes bibliographic references and author index

• NII書誌ID(NCID): BC06605068
• ISBN:
  • 0819420212
• LCCN: 95071190
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: xv, 768 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7871
  • DC21 : 621.36
• 件名:
  • LCSH : Electronics -- Materials -- Optical properties -- Congresses
  • LCSH : Electronics -- Materials -- Testing -- Congresses
  • LCSH : Optoelectronics -- Materials -- Optical properties -- Congresses
  • LCSH : Microelectronics -- Materials -- Optical properties -- Congresses
  • LCSH : Quantum electronics -- Materials -- Optical properties -- Congresses
• 親書誌ID:
  • BA0022700X