Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan

Author(s)

• International Symposium on Polarization Analysis and Applications to Device Technology
• Yoshizawa, Tōru
• Yokota, Hideshi
• Society of Photo-optical Instrumentation Engineers. Japan Chapter
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan

Toru Yoshizawa, Hideshi Yokota, editors ; sponsored by SPIE Japan Chapter ... [et al.] ; published by SPIE--The International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 2873）

SPIE, c1996

Note

Includes bibliographical references and index

Details

• NCID: BC06824243
• ISBN:
  • 0819422711
• LCCN: 96069904
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: xiii, 350 p.
• Size: 28 cm
• Classification:
  • LCC : TA1750
• Subject Headings:
  • LCSH : Electrooptical devices -- Congresses
  • LCSH : Polarizers (Light) -- Congresses
  • LCSH : Optoelectronic devices -- Congresses
  • LCSH : Polarimetry -- Congresses
  • LCSH : Electrooptics -- Congresses
  • LCSH : Refraction, Double -- Congresses
• Parent Bibliography ID:
  • BA0022700X