Three-dimensional imaging and laser-based systems for metrology and inspection II : 20-21 November, 1996, Boston, Massachusetts
著者
書誌事項
Three-dimensional imaging and laser-based systems for metrology and inspection II : 20-21 November, 1996, Boston, Massachusetts
(Proceedings / SPIE -- the International Society for Optical Engineering, v. 2909)
SPIE, c1996
- タイトル別名
-
Three dimensional imaging and laser based systems for metrology and inspection 2
Photonics East
大学図書館所蔵 件 / 全1件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
Includes bibliographic references and index
