Three-dimensional imaging and laser-based systems for metrology and inspection II : 20-21 November, 1996, Boston, Massachusetts

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書誌事項

Three-dimensional imaging and laser-based systems for metrology and inspection II : 20-21 November, 1996, Boston, Massachusetts

Kevin G. Harding, Donald J. Svetkoff, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

(Proceedings / SPIE -- the International Society for Optical Engineering, v. 2909)

SPIE, c1996

タイトル別名

Three dimensional imaging and laser based systems for metrology and inspection 2

Photonics East

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注記

Includes bibliographic references and index

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  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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