{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BC06862639.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BC06862639#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BC06862639.json"},"dc:title":[{"@value":"Three-dimensional imaging and laser-based systems for metrology and inspection II : 20-21 November, 1996, Boston, Massachusetts"}],"dcterms:alternative":["Three dimensional imaging and laser based systems for metrology and inspection 2","Photonics East"],"dc:creator":"Kevin G. Harding, Donald J. Svetkoff, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering","dc:publisher":[{"@value":"SPIE"}],"dcterms:extent":"vii, 262 p.","cinii:size":"28 cm","dc:language":"eng","dc:date":"1996","cinii:ncid":"BC06862639","cinii:ownerCount":"1","foaf:maker":[{"@type":"foaf:Person","foaf:name":[{"@value":"Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection (Symposium)"}]},{"@id":"https://ci.nii.ac.jp/author/DA08803133#entity","@type":"foaf:Person","foaf:name":[{"@value":"Harding, Kevin G."}]},{"@id":"https://ci.nii.ac.jp/author/DA05544061#entity","@type":"foaf:Person","foaf:name":[{"@value":"Svetkoff, Donald J."}]},{"@id":"https://ci.nii.ac.jp/author/DA00848546#entity","@type":"foaf:Person","foaf:name":[{"@value":"Society of Photo-optical Instrumentation Engineers"}]},{"@type":"foaf:Person","foaf:name":[{"@value":"Photonics East"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA000106","@type":"foaf:Organization","foaf:name":"東京科学大学 大岡山図書館","rdfs:seeAlso":{"@id":"https://topics.libra.titech.ac.jp/recordID/catalog.bib/BC06862639"}}],"bibo:lccn":["96069761"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/96069761"}],"prism:publicationDate":["c1996"],"cinii:note":["Includes bibliographic references and index"],"dc:subject":["LCC:TK8315","DC21:681/.25"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Three-dimensional+imaging+--+Congresses","dc:title":"Three-dimensional imaging -- Congresses"},{"@id":"https://ci.nii.ac.jp/books/search?q=Lasers+--+Congresses","dc:title":"Lasers -- Congresses"},{"@id":"https://ci.nii.ac.jp/books/search?q=Optical+measurements+--+Congresses","dc:title":"Optical measurements -- Congresses"},{"@id":"https://ci.nii.ac.jp/books/search?q=Moire+topography+--+Congresses","dc:title":"Moire topography -- Congresses"},{"@id":"https://ci.nii.ac.jp/books/search?q=Engineering+inspection+--+Congresses","dc:title":"Engineering inspection -- Congresses"}],"dcterms:isPartOf":[{"@id":"https://ci.nii.ac.jp/ncid/BA0022700X#entity","dc:title":"Proceedings / SPIE -- the International Society for Optical Engineering, v. 2909","@type":"bibo:Book"}],"dcterms:hasPart":[{"@id":"urn:isbn:0819423114"}]}]}