Scientific detection of fakery in art : 29-30 January 1998, San Jose, California

著者

• McCrone, Walter C.
• Chartier, Duane R.
• Weiss, Richard J.
• IS&T--the Society for Imaging Science and Technology
• Society of Photo-optical Instrumentation Engineers

書誌事項

Scientific detection of fakery in art : 29-30 January 1998, San Jose, California

Walter McCrone, Duane R. Chartier, Richard J Weiss, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3315）

The Society, c1998

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BC07201428
• ISBN:
  • 0819427551
• LCCN: 98227309
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: v, 106 p.
• 大きさ: 28 cm
• 分類:
  • LCC : N8790
  • DC21 : 702/.8/74
• 件名:
  • LCSH : Art -- Forgeries -- Congresses
  • LCSH : Art -- Expertising -- Congresses
  • LCSH : Art and science -- Congresses
• 親書誌ID:
  • BA0022700X